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Operational
|
2001
|
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Source characteristics
|
Bend magnet
|
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Energy range
|
3-12 keV
|
|
Monochromator
|
None
|
|
Endstations
|
Small hutch with wafer scanner
|
|
Calculated spot size at sample
|
100 x 10 mm
|
|
Samples
|
|
Format
|
Wafers with resist coating
|
|
Sample environment
|
Ambient, air
|
|
Scientific applications
|
Deep-etch x-ray lithography (LIGA)
|
|
Local contact
|
Name: Cheryl Hauck
Phone: (510) 486-7885
Fax: (510) 486-4102
Email: cahauck@lbl.gov
|
|
Spokesperson
|
Name: Dale Boehme
Affiliation: AXSUN Technologies Inc.
Phone: (925) 373-3174, ext. 102
Fax: (925) 373-3178
Email: dboehme@axsun.com
|