Operational

Now

Source characteristics

Bend magnet

Energy range

300-900 eV

Monochromator

Zone-plate linear

Calculated flux (1.9 GeV, 400 mA)

Images with 1000 x 1000 pixels,
1000 photons/pixel recorded in 3 s at 517 eV, 0.2%BW

Resolving power (E/DE)

500-700

Endstations

X-ray microscope (XM-1)

Characteristics

Full-field soft x-ray microscope

Spatial resolution

25 nm

Detectors

Back-thinned CCD camera

Field of view

10 µm single field; larger areas can be tiled together like a mosaic

Samples

Format

Thin samples (up to 10 µm thick) on silicon nitride or other foils, wet chamber provided

Preparation

Sample dependent

Sample environment

Helium at atmospheric pressure, wet or dry, low temperature (cryo)

Special notes

Mutual indexing system with visible-light microscopy provided to position and focus sample

Scientific applications

Biology, magnetic materials, environmental sciences, material sciences, polymers

Local contacts

Name: Angelic Pearson
Phone: (510) 486-4079
Fax: (510) 486-4550
Email: alpearson@lbl.gov

Name: Gerd Schneider
Phone: (510) 486-7052
Email: grschneider@lbl.gov

Spokespersons

Name: Gregory Denbeaux
Affiliation: Center for X-Ray Optics, Berkeley Lab
Phone: (510) 486-4051
Fax: (510) 486-4550
Email: gpdenbeaux@lbl.gov

Name: David Attwood
Affiliation: Center for X-Ray Optics, Berkeley Lab
Phone: (510) 486-4463
Fax: (510) 486-495
Email: dtattwood@lbl.gov