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Beamline 7.3.3

X-Ray Microdiffraction, Hard X-Ray Technique Development

Operational

Now

Source characteristics

Bend magnet

Energy range

6-12 keV

Monochromator

White light and monochromatic [two- and four-crystal Ge(111)]

Calculated flux (1.9 GeV, 400 mA)

Monochromatic (at typically 8.5 keV):
1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot)
1 x 1012 photons/s/3x10-4BW (100 x 300 µm spot)

Resolving power (E/DE)

1000-7000 depending on vertical convergence accepted

Endstations

X-ray microdiffraction, test station for hard x-ray technique development

Characteristics

X-ray microdiffraction: Microprobe, white-light, and monochromatic experiments

Test station: White or monochromatic light

Detectors

X-ray CCD, image plate, fluorescence Si(Li) detector

Spot size at sample

100 x 300 µm down to 1 x 1 µm

Samples

Format

Typically less than 1 cm2 x 1 mm thick

Sample environment

Typically air

Scientific applications

Measurement of thin film strain, environmental science, hard x-ray technique development

Local contacts/spokespersons

Name: Nobumichi Tamura (x-ray microdiffraction)
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-6189
Fax: (510) 486-7696
Email: ntamura@lbl.gov

Name: A.A. MacDowell (hard x-ray technique development)
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-4276
Fax: (510) 486-7696
Email: aamacdowell@lbl.gov

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