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Beamline 9.3.2Chemical and Materials Science,
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Operational |
Now |
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Source characteristics |
Bend magnet |
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Energy range |
30-1400 eV |
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Monochromator |
SGM (gratings: 100, 600, 1200 lines/mm) |
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Calculated flux (1.9 GeV, 400 mA) |
~1011 photons/s/0.1%BW at 400 eV |
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Resolving power (E/DE) |
3000 typical, 8000 max (with 10-µm slits) |
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Endstation |
Advanced materials chamber (AMC) |
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Characteristics |
PHI analyzer, sample preparation with LEED, XPS, evaporation, sputtering, precision manipulator |
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Spatial resolution |
0.5 x 1 mm |
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Detectors |
16-element multichannel detector, partial electron yield detector |
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Spot size at sample |
0.5 x 1 mm |
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Samples |
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Format |
UHV-compatible solids up to 10 mm in diameter |
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Preparation |
LEED, sputtering, evaporation, quartz-crystal oscillator, XPS, large-gap in-situ magnet; heating up to 2300 K; cooling down to 200 K |
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Sample environment |
UHV |
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Special notes |
Sample transfer capability |
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Scientific applications |
Studies of atomic and electronic structure of surfaces |
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Experimental techniques |
Photoelectron diffraction, XPS, NEXAFS, MCD |
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Local contact/spokesperson |
Name: Nasser Hamdan |
Table of all beamlines