Operational

Now

Source characteristics

Bend magnet

Energy range

0.002 - 3 eV

Frequency range

15 - 25,000 cm^-1

Interferometer resolution

0.125 cm^-1

Endstations

Bruker IFS66v/S FTIR (vacuum),
UHV surface-science chamber

Characteristics

Rapid- and step-scan FTIR, down to 5-ns time resolution, reflection and transmission modes

Spatial resolution

Diffraction limited (~ wavelength)

Detectors

Silicon bolometer (LHe cooled)
Wide-range MCT (mercury cadmium telluride)
Gap diode
Silicon diode
Fast silicon diode
DTGS mid-IR
DTGS far-IR

Spot size at sample

1 mm (varies with coupling optics)

Samples

Preparation

Stereo microscope and table available,
UHV surface-science chamber

Sample environment

Vacuum: 10^-2 Torr in main FTIR bench or 10^-9 Torr in surface-science chamber. LHe cryostat available for 2 - 475 K.

Scientific applications

Submonolayers on surfaces, polymers, semiconductors, superconductors, environmental samples, forensic studies, etc.

Local contact

Name: Michael C. Martin
Phone: (510) 495-2231
Fax: (510) 486-7696
Email: mcmartin@lbl.gov

Spokesperson

Name: Wayne R. McKinney
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-4395
Fax: (510) 486-7696
Email: wrmckinney@lbl.gov