Operational

Now

Source characteristics

Bend magnet

Energy range

6 - 15 keV (with multilayer mirrors)
3 - 20 keV (without multilayer mirrors)

Monochromator

White light, multilayer mirrors in Kirkpatrick-Baez configuration

3 x 10¹⁰ photons/s at 12.5 keV

25 at 12.5 keV

Endstations

Large hutch with optical table

Characteristics

X-ray fluorescence analysis of samples with high elemental sensitivity and high spatial resolution

Spatial resolution

1.0 x 1.2 µm

Detectors

Si(Li)

Spot size at sample

1.0 x 1.2 µm

Samples

Format

Usually flat solids < 2 cm in diameter mounted between two layers of superclean polypropylene

Sample environment

Air

Special notes

By special arrangement, the focusing mirrors can be removed and white-light beam can be used (e.g., testing capillary optics, evaluating x-ray collimators)

Scientific applications

Trace-element analysis with high spatial resolution; for example, silicon solar cells, GaN, atmospheric particulates, environmental soil samples, and biological samples; testing of x-ray capillary optics and new x-ray detectors

Local contact

Name: Scott McHugo
Phone: (510) 486-4874
Fax: (510) 486-7696
Email: samchugo@lbl.gov

Spokesperson

Name: Al Thompson
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 486-5590
Fax: (510) 486-7696
Email: acthompson@lbl.gov