Beamline

Source*

Areas of Research/Techniques

Energy Range

Available

1.4.1

Ultraviolet photoluminescence

1.4.2

Visible and infrared Fourier transform spectroscopy (FTIR)

1.4.3

Infrared spectromicroscopy

3.1

Diagnostic beamline

3.3.2

Deep-etch x-ray lithography (LIGA)

4.0.1-2

Magnetic spectroscopy

5.0.1

Monochromatic protein crystallography

5.0.2

Multiple-wavelength anomalous diffraction (MAD) and monochromatic protein crystallography

5.0.3

Monochromatic protein crystallography

5.3.1

Femtosecond phenomena

5.3.2

Polymer scanning transmission x-ray microscopy

6.1.2

High-resolution zone-plate microscopy

6.3.1

Calibration and standards, EUV/soft x-ray optics testing, solid-state chemistry

6.3.2

Calibration and standards; EUV optics testing; atomic, molecular, and materials science

7.0.1

Surface and materials science, spectromicroscopy, spin resolution, photon-polarization dichroism

7.3.1.1

Magnetic microscopy, spectromicroscopy

7.3.1.2

Surface and materials science, micro x-ray photoelectron spectroscopy

7.3.3

Micro x-ray diffraction, micro x-ray absorption spectroscopy, hard x-ray optics testing

8.0.1

Surface and materials science, imaging photoelectron spectroscopy, soft x-ray fluorescence

9.0.1

Coherent optics experiments

9.0.2

Chemical reaction dynamics, photochemistry, high-resolution photoelectron and photoionization spectroscopy, photoelectron and photoionization imaging and spectroscopy

9.3.1

Atomic, molecular, and materials science

9.3.2

Chemical and materials science, circular dichroism, spin resolution

10.0.1

Photoemission of highly correlated materials; high-resolution atomic, molecular, and optical physics

10.3.1

X-ray fluorescence microprobe

10.3.2

Environmental and materials science, micro x-ray absorption spectroscopy

11.3.2

Inspection of EUV lithography masks

12.0.1

Surface and materials science, spectromicroscopy, EUV optics testing, interferometry, coherent optics

BTF

Beam Test Facility