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Beamline 1.4.3

Infrared spectromicroscopy

Operational

Now

Source characteristics

Bend magnet

Energy range

0.05–1.2 eV

Frequency range

100–10,000 cm-1

Interferometer resolution

0.125 cm-1

Endstations

Nicolet Magna 760 FTIR, Nic-Plan IR microscope (N2 purged)

Characteristics

Motorized sample stage, 0.1-micron resolution, reflection, transmission, and grazing-incidence reflection modes

Spatial resolution

Diffraction limited (~wavelength)

Detectors

MCT-A (mercury cadmium telluride), Si bolometer (LHe cooled)

Spot size at sample

3-10 µm (diffraction limited)

Samples

Preparation

Stereo microscope, table, ALS user wet and biological labs available

Sample environment

N2 purged, minimal clean area (no particle specification), microcryostat/heater stages available for 4.2–730 K

Scientific applications

Biological samples, forensic studies, laminates, polymers, fibers, environmental samples, particulate contamination

Local contact/spokespeson

Name: Michael C. Martin
Affiliation: Advanced Light Source, Berkeley Lab
Phone: (510) 495-2231
Fax: (510) 495-2067

Beamline phone number

(510) 495-2014

A data sheet about this beamline is available as a PDF file.

More information about IR research at the ALS is available on the Infrared Beamlines Web site.

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Diagram of all beamlines