Beamline 11.0.2
Molecular Environmental Science
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Operational |
Now |
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Source characteristics |
5.0-cm-period elliptical polarization undulator (EPU5) |
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Energy range |
See endstation tables |
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Monochromator |
See endstation tables |
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Endstations |
Wet spectroscopy |
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| Local contacts | Name: Hendrik Bluhm Phone: (510) 495-2796 Fax: (510) 486-5596 Email: hbluhm@lbl.gov Name: Tolek Tyliszczak Phone: (510) 486-5188 Fax: (510) 495-2067 Email: tolek@lbl.gov |
Name: Mary K. Gilles Phone: (510) 495-2775 Fax: (510) 495-2067 Email: mkgilles@lbl.gov |
| Spokesperson | Name: David Shuh Affiliation: Chemical Sciences Division, Berkeley Lab Phone: (510) 486-6937 Fax: (510) 486-5596 Email: dkshuh@lbl.gov |
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Wet spectroscopy |
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Energy range |
95-2000 eV |
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Monochromator |
Variable-included-angle PGM |
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Calculated flux (1.9 GeV, 400 mA) |
1012 -1013 photons/s |
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Resolving power (E/ΔE) |
2500-7500 |
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Spot size at sample (FWHM) |
6 x 11 µm |
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Sample environment |
UHV, wet environments |
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Scientific applications |
Wet molecular environmental science |
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Experimental techniques |
XPS, NEXAFS, x-ray emission spectroscopy |
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Local contact/spokesperson |
Name: David Shuh |
High-pressure photoemission spectroscopy |
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Energy range |
95-2000 eV |
Monochromator |
Variable-included-angle PGM |
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Calculated flux (1.9 GeV, 400 mA) |
1012-1013 photons/s |
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Resolving power (E/ΔE) |
2500-7500 |
Spot size at sample (FWHM) |
6 x 11 µm |
Sample environment |
UHV, high pressure to 10 Torr |
Scientific applications |
Wet molecular environmental science, catalysis |
Experimental techniques |
XPS, NEXAFS |
Local contact |
Name: Hendrik Bluhm |
Spokesperson |
Name: David Shuh |
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Scanning transmission x-ray microscope (STXM) |
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Energy range |
130-2000 eV |
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Monochromator |
Variable-included-angle PGM |
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Calculated flux (1.9 GeV, 400 mA) |
~109 photons/s |
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Resolving power (E/ΔE) |
2500-7000 |
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Characteristics |
Used to make x-ray images and NEXAFS spectra of thin samples in transmission. Chemical mapping at 30-nm resolution. Polarization studies. |
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Spatial resolution |
Scanning microscope with focusing by means of Fresnel zone plates; resolution determined by spot size, which is 30 or 40 nm with current zone plates. Single features of smaller dimension can be analyzed. |
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Detectors |
Photon-counting detector behind the sample records the intensity of the transmitted radiation, generating an image pixel by pixel during the rastering. Fast avalanche photodiode to provide time-resolved measurements in multibunch mode. |
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Spot size at sample |
30 or 40 nm with current zone plates |
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Samples |
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Format |
Thin sections, films, and particulates (50–1000 nm thick); 3 x 3 mm in area |
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Preparation |
No preparation chamber available |
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Sample environment |
Helium up to 1 atm, vacuum to 10-2 Torr, inert gas up to 1 atm |
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Special notes |
Samples may be wet or dry; thin films may be deposited on silicon nitride windows or TEM grid. External magnetic field can be applied—up to 600 G. |
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Scientific applications |
Molecular environmental science STXM, materials sciences, life sciences, magnetic materials |
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Experimental techniques |
Imaging, NEXAFS in small spots; chemical mapping at 30-nm resolution |
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Local contact |
Name: Tolek Tyliczszak |
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Spokesperson |
Name: David Shuh |
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