Beamline 12.3.2

X-ray microdiffraction

Operational	Spring 2007
Source characteristics	Superbend
Energy range	6–22 keV
Monochromator	White light and monochromatic [four-crystal Si(111)]
Calculated flux (1.9 GeV, 400 mA)	At typically 8.5 keV: 1 x 10⁹ photons/s/µm²/3x10^-4BW (1 x 1 µm spot)
Resolving power (E/ΔE)	1000–7000 depending on vertical convergence accepted
Detectors	X-ray CCD, fluorescence Ge detector
Spot size at sample	16 x 2 µm² down to 0.5 x 0.5 µm²
Samples
Format	Typically less than 1 cm² x 1 mm thick
Sample environment	Typically air
Special notes	Microprobe, polychromatic and monochromatic experiments
Scientific applications	Stress measurements in thin films and bulk materials. Spatially resolved sample characterization by diffraction and fluorescence techniques for materials science and earth and environmental sciences.
Local contacts/spokespersons	Nobumichi Tamura Affiliation: Advanced Light Source, Berkeley Lab Phone: (510) 486-6189 Fax: (510) 486-7696
Beamline phone numbers	n/a

More information about x-ray microdiffraction at the ALS is available at the Microdiffraction Web site.