Operational

Now

Source characteristics

Bend magnet

Energy range

300-1300 eV

Monochromator

Zone-plate linear

Measured flux (1.9 GeV, 400 mA)

Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW

Resolving power (E/ΔE)

500-700

Endstations

X-ray microscope (XM-1)

Characteristics

Full-field soft x-ray transmission microscope

Spatial resolution

25 nm

Detectors

Back-thinned 2048- x 2048-pixel CCD camera

Field of view

15 µm single field; virtually unlimited larger areas can be tiled together like a mosaic

Samples

Format

Thin films (OD=1, for specific sample calculation see http://www.cxro.lbl.gov/optical_constants/) deposited typically on Si₃N₄ membrane (similar to TEM substrates) or other x-ray-transparent substrates

Preparation

Sample dependent

Sample environment

External magnetic fields up to 5 kOe in  beam direction and 2 kOe along the sample plane; tilted sample holder for in-plane magnetized samples; He at atmospheric pressure, wet or dry, low temperature (cryo)

Special notes

Mutual indexing system with visible-light microscopy provided to position and focus sample

Scientific applications

Transmission imaging x-ray microscopy for magnetic materials (XMCD contrast), materials sciences, environmental sciences, polymers and biological samples; x-ray tomography for 3-dimensional imaging

Local contact/spokesperson

Name: Peter Fischer
Affilitation: Center for X-Ray Optics, Berkeley Lab
Phone: (510) 486-7052
Fax: (510) 486-4550
Email: pjfischer@lbl.gov

Beamline phone number

(510) 495-2061