Operational

Now

Source characteristics

5-cm-period undulator (U5) (first, third, and fifth harmonics)

Energy range

65-1400 eV (1.5 GeV); ~80-1400 eV (1.9 GeV)

Monochromator

SGM (gratings: 150, 380, 925 lines/mm)

Flux (1.9 GeV, 400 mA)

10¹¹ to 6 x 10¹⁵ photons/s (resolution and energy dependent)

Resolving power (E/ΔE)

<8000

Endstations

Ellipsoidal-mirror electron energy analyzer (EMA)
Soft x-ray fluorescence (SXF) spectrometer

Beamline phone numbers

(510) 495-2080, (510) 495-2089

Endstation

Ellipsoidal-mirror electron energy analyzer (EMA)

Characteristics

Measures 84° of electron emission angles from solid samples with 80-meV resolution

Spot size at sample

100 µm

Samples

Format

UHV-compatible solids up to 2.5 x 1 cm

Preparation

In-situ resistive heating, ion sputtering, and evaporation

Sample environment

UHV

Special notes

Sample preparation chamber, transfer capabilities

Scientific applications

Condensed matter science, surface science

Experimental techniques

XPS, ARPES, NEXAFS

Local contact

Jonathan Denlinger
Phone: (510) 495-2067
Fax: (510) 486-2067

Spokesperson

Franz Himpsel
Affiliation: University of Wisconsin-Madison
Phone: (608) 263-5590
Fax: (608) 263-2334

Endstation

Soft x-ray fluorescence (SXF) spectrometer

Characteristics

Measures the soft x-ray emission from solid samples with a dispersive grating spectrometer

Spot size at sample

100 (h) x 50 to 3000 (v) µm

Samples

Format

UHV-compatible solids up to 2 cm in diameter; 5-mm diameter optimal

Sample environment

UHV

Special notes

Sample transfer capabilities

Experimental techniques

SXF, NEXAFS, fluorescence-yield XAS of solids

Local contact

Jonathan Denlinger
Phone: (510) 495-2067
Fax: (510) 486-2067

Spokesperson

Thomas Callcott
Affiliation: University of Tennessee
Phone: (865) 974-8944
Fax: (865) 974-3949