Frontiers of Synchrotron-Based X-Ray Microdiffraction

Saturday October 22 (9:00 a.m.-4:00 p.m.)
X-ray microdiffraction using submicron size beam is a powerful tool for characterizing structural and mechanical properties of materials. This workshop will present the latest developments in the technique and its applications and outline the benefits of the upcoming upgrade of the
current ALS BL7.3.3. microdiffraction end-station onto a fully dedicated superbend beamline (BL12.3.2.). More information for this workshop will be posted soon at:
http://xraysweb.lbl.gov/microdif/

Tentative schedule (PDF) posted September 16, 2005.

Organizers: Nobumichi Tamura and B. W. Batterman