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Tuesday, 20 October 2009 08:30 |
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Endstations:
| GENERAL BEAMLINE INFORMATION |
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Operational
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2011
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Source characteristics
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9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9)
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Energy range
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9eV-120eV with current gratings
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| Monochromator |
Variable-included-angle spherical grating monochromator (SGM)
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| Calculated flux (1.9 GeV, 400 mA) |
1012 photons/s/0.01%BW at 100 eV |
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Resolving power (E/ΔE)
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High flux 1200 lines/mm; ~1/25,000
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Endstations
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High-resolution inelastic scattering (MERIXS) and ARPES
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Characteristics
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Milli-Electron-volt Resolution beamLINe (MERLIN): Ultrahigh-resolution inelastic scattering and angle-resolved photoemission
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Detectors
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meV-resolution soft x-ray spectrograph and Scienta R8000 analyzer
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| Sample format |
Solid-state samples up to 1 cm2 in area |
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Sample preparation
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Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability
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Sample environment
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UHV, sample heating and cooling
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| Special notes |
Polarization is user-selectable between linear horizontal, linear vertical, and left and right circular polarization. |
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Scientific applications
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Study of electronic structure of strongly correlated systems
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Local contacts
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Advanced Light Source, Berkeley Lab
Phone: (510) 495-2328
Fax: (510) 495-2067
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Advanced Light Source, Berkeley Lab
Phone: (510) 486-5648
Fax: (510) 495-2067
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Advanced Light Source, Berkeley Lab
Phone: (510) 495-2779
Fax: (510) 495-2067
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| Spokepersons |
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University of California, Berkeley
Phone: (510) 642-4863
Fax: (510) 643-8497
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Princeton University
Phone: (609) 258-3044
Fax: (609) 258-1006
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Beamline phone number
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(510) 495-2049
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| ENDSTATION INFORMATION |
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Endstation name
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MERIXS: High-resolution inelastic scattering
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Energy range
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9eV-100eV with current gratings |
| Spot size at sample |
< 30 x 200 µm2 |
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Characteristics
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Measures total electron yield, total fluorescence yield, X-ray emission spectra |
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Calculated flux (1.9 GeV, 400 mA)
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1012 photons/s/0.01%BW at 100 eV |
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Detectors
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2m high resolution VLS spectrograph
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| Sample format |
Solid-state samples up to 1 cm2 in area |
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Sample preparation
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Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability
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Sample environment
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UHV, sample heating and cooling. <10-9 torr, 15K-700K
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Scientific applications
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Study of electronic structure of strongly correlated systems
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| ENDSTATION INFORMATION |
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Endstation name
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ARPES: Angle-resolved photoemission spectroscopy
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Energy range
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9eV-100eV with current gratings |
| Spot size at sample |
< 20 x 200 µm2 |
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Characteristics
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Measures total electron yield, total fluorescence yield, and photoemission spectra |
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Calculated flux (1.9 GeV, 400 mA)
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1012 photons/s/0.01%BW at 100 eV |
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Detectors
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Scienta R8000
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| Sample format |
Solid-state samples up to 1 cm2 in area |
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Sample preparation
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In-vacuum cleave, sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability.
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Sample environment
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UHV, sample heating and cooling. 10-11 torr, 5K-400K
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Scientific applications
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Study of electronic structure of strongly correlated systems
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About the ALS 
