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Beamline 4.0.3 Print
Tuesday, 20 October 2009 08:30

 

High-resolution spectroscopy of complex materials (MERLIN)

 

Endstations:

 

GENERAL BEAMLINE INFORMATION

Operational

2011

Source characteristics

9.0-cm-period quasiperiodic elliptical polarization undulator (EPU9)

Energy range

9eV-120eV with current gratings

Monochromator Variable-included-angle spherical grating monochromator (SGM)
Calculated flux (1.9 GeV, 400 mA) 1012 photons/s/0.01%BW at 100 eV

Resolving power (E/ΔE)

High flux 1200 lines/mm; ~1/25,000

Endstations

High-resolution inelastic scattering (MERIXS) and ARPES

Characteristics

Milli-Electron-volt Resolution beamLINe (MERLIN): Ultrahigh-resolution inelastic scattering and angle-resolved photoemission

Detectors

meV-resolution soft x-ray spectrograph and Scienta R8000 analyzer

Sample format Solid-state samples up to 1 cm2 in area

Sample preparation

Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability

Sample environment

UHV, sample heating and cooling

Special notes Polarization is user-selectable between linear horizontal, linear vertical, and left and right circular polarization.

Scientific applications

Study of electronic structure of strongly correlated systems

Local contacts

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Advanced Light Source, Berkeley Lab
Phone: (510) 495-2328
Fax: (510) 495-2067

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Advanced Light Source, Berkeley Lab
Phone: (510) 486-5648
Fax: (510) 495-2067

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Advanced Light Source, Berkeley Lab
Phone: (510) 495-2779
Fax: (510) 495-2067

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University of California, Berkeley
Phone: (510) 642-4863
Fax: (510) 643-8497
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Princeton University
Phone: (609) 258-3044
Fax: (609) 258-1006

Beamline phone number

(510) 495-2049

 

ENDSTATION INFORMATION

Endstation name

MERIXS: High-resolution inelastic scattering

Energy range

9eV-100eV with current gratings
Spot size at sample < 30 x 200 µm2

Characteristics

Measures total electron yield, total fluorescence yield, X-ray emission spectra

Calculated flux (1.9 GeV, 400 mA)

1012 photons/s/0.01%BW at 100 eV

Detectors

2m high resolution VLS spectrograph

Sample format Solid-state samples up to 1 cm2 in area

Sample preparation

Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability

Sample environment

UHV, sample heating and cooling. <10-9 torr, 15K-700K

Scientific applications

Study of electronic structure of strongly correlated systems

 

ENDSTATION INFORMATION

Endstation name

ARPES: Angle-resolved photoemission spectroscopy

Energy range

9eV-100eV with current gratings
Spot size at sample < 20 x 200 µm2

Characteristics

Measures total electron yield, total fluorescence yield, and photoemission spectra

Calculated flux (1.9 GeV, 400 mA)

1012 photons/s/0.01%BW at 100 eV

Detectors

Scienta R8000

Sample format Solid-state samples up to 1 cm2 in area

Sample preparation

In-vacuum cleave, sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability.

Sample environment

UHV, sample heating and cooling. 10-11 torr, 5K-400K

Scientific applications

Study of electronic structure of strongly correlated systems