|Back to calendar|
|Title:||ALS-CXRO Seminar | Peter Fischer|
|When:||02/20/2013 3:00 PM - 4:00 PM|
|Description:||ALS-CXRO Seminar Series|
Wed, February 20, 2013
XM-3 – A next generation full-field soft X-ray microscope for mesoscale research at LBNL
The current transformation from nano to mesoscale research will exploit the complexity of nanoscale phenomena occurring on mesoscales to create new behavior and properties of materials which in turn allow for novel functionalities of devices. This enterprise can only be successful with concomitant advances in characterization instrumentation. Soft X-ray microscopies have been instrumental for nanoscale research, since they use the unique properties of soft X-rays to combine high spatial and temporal resolution, elemental specificity, and magnetic sensitivity by using the strong X-ray dichroism effect in the soft x-ray regime as magnetic contrast. Three-dimensional (3D) soft X-ray tomography using Fresnel zone plate based transmission soft x-ray microscopies is routinely used at synchrotron sources but almost exclusively for biological imaging. The first next-generation full-field soft x-ray microscope at an undulator source started operation recently at the HZB (former BESSY) in Germany. It has demonstrated a spectral resolution of 104, covering a field of view of 10μm with exposure times of about 1sec allowing to perform nano-spectro-tomography, which will provide key information in mesoscale research.
I will present recent results from full-field soft x-ray microscopies indicating the opportunity to establish XM-3, a next generation full-field soft X-ray microscope at LBNL, which will become a unique and complementary facility within the suite of instrumentation at ALS to facilitate research in areas of strategic importance to LBNL.