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|Title:||ALS-CXRO Seminar Series | Shrawan Mishra|
|When:||02/19/2014 3:00 PM - 4:00 PM|
|Description:||ALS/CXRO Seminar Series|
Wed, Feb 19, 2014
6-2202 Conf Rm
Exploring magneto-chemical interstates in magnetic multilayers via soft x-ray resonant magnetic scattering
Exploiting soft x-ray resonant magnetic scattering, interfacial magneto-chemical profile of various exchange-coupled bilayers will be discussed. Using the depth sensitivity of resonant soft x-ray scattering it is found that nominally sharp structural interfaces do not necessarily imply a sharp electronic (or magnetic) interface. In this talk, I will present a broader view of interfacial roughness and electronic heterogeneity in compared with non-resonant characterization methods, a result which compels us to generalize the notion of interface roughness on a larger prospective. The magnetic depth profile of exchange coupled oxides bilayers provides the direct evidence of formation of a “magnetically dead” interlayer. Recent experimental findings suggest that simultaneous control of electronic and magnetic interface is essential in realizing the potential of future spintronic devices.