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Beamline 5.4.1 Print

 

Infrared spectromicroscopy

 

GENERAL BEAMLINE INFORMATION

Operational

2011

Source characteristics

Bend magnet

Energy range

0.07–1.25 eV

Frequency range

600 - 10,000 cm-1

Interferometer resolution

0.125 cm-1

Endstations

FTIR bench and IR microscope (N2 purged)

Characteristics

Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics

Spatial resolution

Diffraction limited (~wavelength)

Detectors

Probably MCT-A*, MCT-B (mercury cadmium telluride)

Spot size at sample

2-10 µm (diffraction-limited)

Sample preparation

Biological preparation equipment available including incubator, biohoods, prep table, and more TBD.

Sample environment

N2 purged, minimal clean area (no particle specification), microcryostat/heater stages available for 4.2–730 K

Scientific applications

Biological samples, environmental samples, novel compounds, forensic studies, laminates, polymers, fibers, particulate contamination, material sciences, gas phase molecules and clusters.

Local contact / Spokespeson

Michael C. Martin
Advanced Light Source, Berkeley Lab
Phone: (510) 495-2231
Fax: (510) 495-2067

 

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Environmental Sciences Division, Berkeley Lab
Phone: (510) 486-7118
Fax: (510) 486-5686

Beamline phone number

(510) 495-2654

 

More information about IR research at the ALS is available on the Infrared Beamlines Web site.