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Tuesday, 20 October 2009 09:34 |
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Microdiffraction
Scientific disciplines: Materials, earth and environmental sciences
| GENERAL BEAMLINE INFORMATION |
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Operational
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Now
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| Proposal cycle |
Proposals for General Sciences Beamlines (6-month cycle) |
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Source characteristics
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Superbend magnet
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Energy range
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6–22 keV
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| Frequency range |
2.1-0.56 Ångström wavelength |
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Monochromator
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White light and monochromatic [four-crystal Si(111)]
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Calculated flux (1.9 GeV, 400 mA)
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Typically 8.5 keV:
1 x 109 photons/s/µm2/3x10-4BW (1 x 1 µm spot)
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Resolving power (E/ΔE)
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1000–7000 depending on vertical convergence accepted
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Detectors
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MAR 133 CCD, Dectris Pilatus 1M Pixel detector, Silicon drift detector
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Spot size at sample
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16 x 2 µm2 down to 0.5 x 0.5 µm2
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Sample format
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Typically less than 1 cm2 x 1 mm thick |
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Sample environment
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Typically air
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| Special notes |
Microprobe, polychromatic and monochromatic experiments |
| Scientific applications |
Stress measurements in thin films and bulk materials. Spatially resolved sample characterization by diffraction and fluorescence techniques for materials, earth and environmental sciences. |
| Local contact |
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab
Phone: (510) 486-6789
Fax: (510) 486-7696 |
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Spokesperson
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Advanced Light Source, Berkeley Lab
Phone: (510) 486-6189
Fax: (510) 486-7696
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Beamline phone
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(510) 486-4625
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| Website |
https://sites.google.com/a/lbl.gov/bl12-3-2/  |
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