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Beamline 11.0.1 Print
Tuesday, 20 October 2009 09:16

 

PEEM3, Soft X-Ray Scattering

 

Scientific disciplines: Magnetism, materials, surface science, polymers

 

Endstations:

 

GENERAL BEAMLINE INFORMATION

Operational

Yes

Proposal cycle Proposals for General Sciences Beamlines (6-month cycle)

Source characteristics

5.0-cm period elliptical polarization undulator (EPU5)

Energy range

150–2000 eV

Monochromator

VLS-PGM

Calculated flux (1.9 GeV, 400 mA) 1013 photons/s/0.1%BW at 800 eV
Resolving power (E/ΔE) 4,000 at 800 eV
Endstations 11.0.1.1: Photoemission electron microscope (PEEM3)
11.0.1.2: Soft x-ray scattering
Special notes Polarization is user selectable; linear polarization continuously variable from horizontal to vertical; left and right elliptical (or circular) polarization
Scientific disciplines Magnetism, materials, surface science, polymers.
Scientific applications Real-time and pump-probe study of elemental, chemical, magnetic, and topographical properties of materials
Local contacts

Andreas Scholl
Advanced Light Source, Berkeley Lab
Phone: (510) 486-6920
Fax: (510) 486-7696

 

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Advanced Light Source, Berkeley Lab
Phone: (510) 486-7746
Fax: (510) 486-7696

Spokesperson Joachim Stöhr
Stanford Synchrotron Radiation Laboratory
Phone: (650) 926-2570
Fax: (650) 926-4100
Beamline phone (510) 495-2010
Website http://xraysweb.lbl.gov/peem2/webpage/Home.shtml

 

ENDSTATION INFORMATION
Endstation name
11.0.1.1: Photoemission electron microscope (PEEM3)
Detectors Slow scan CCD, fast APD point detector
Characteristics X-ray absorption spectromicroscopy
Spatial resolution Better than 50 nm depending on sample
Spot size at sample Adjustable down to 10 x 10 µm
Sample format UHV-compatible, flat, conductive samples up to 20 mm x 20 mm in area
Sample preparation Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability
Sample environment UHV, sample heating (800 K) and cooling (25 K), current pulses down to 20 ns
Scientific applications Real-time and pump-probe study of elemental, chemical, magnetic, and topographical properties of materials

 

ENDSTATION INFORMATION
Endstation name
11.0.1.2: Soft x-ray scattering
Detectors In-vacuum CCD, PhotoDiode
Characteristics X-ray scattering using resonant soft x-ray
Spatial resolution >2 nm
Spot size at sample 100 x 100 µm
Sample format Polymer thin films, solid thin films, vacuum compatible liquid cell
Sample environment High vacuum, heating
Scientific applications Polymer science, energy research
Local contact

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Advanced Light Source, Berkeley Lab
Phone: (510) 486-6435

 

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Advanced Light Source, Berkeley Lab

Phone: (510) 486-4082