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Beamline 5.4.1 Print

 

Infrared spectromicroscopy

 

GENERAL BEAMLINE INFORMATION

Operational

2011

Source characteristics

Bend magnet

Energy range

0.05–1.00 eV

Frequency range

650 - 10,000 cm-1

Interferometer resolution

Up to 0.125 cm-1

Endstations

FTIR bench and IR microscope (N2 purged)

Characteristics

Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics

Spatial resolution

Diffraction limited (~wavelength)

Detectors

Extended-range and wide-range MCT-A (mercury cadmium telluride)

Spot size at sample

2-10 µm (diffraction-limited), or 20 nm (AFM tip limited)

Sample preparation

Stereo microscope, preparation table, ALS user wet and biological labs available, biohood, incubator

Sample environment

N2 purged, minimal clean area (no particle specification), cryostat available for 4–350 K

Scientific applications

Biological samples, environmental samples, novel compounds, forensic studies, laminates, polymers, fibers, particulate contamination, material sciences, gas phase molecules and clusters.

Special notes Motorized sample stage, 0.1 micron resolution, reflection, transmission and grazing incidence modes.  Nano-FTIR requires smaller samples to be mounted on piezo stack

Local contact / Spokespeson

Michael C. Martin
Advanced Light Source, Berkeley Lab
Phone: (510) 495-2231
Fax: (510) 495-2067

 

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Earth Sciences Division, Berkeley Lab
Phone: (510) 486-7118
Fax: (510) 486-5686

Beamline phone number

(510) 495-2654

 

More information about IR research at the ALS is available on the Infrared Beamlines Web site.