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ALS Beamlines Directory Print


Beamlines, Parameters, Contact Information, and Schedules


Click on the image to download a high-resolution version of the ALS beamclock.

 

Beamline Parameters

Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational.
Individual beamline schedules are posted when available.

Please contact the responsible beamline scientist for additional schedule information. When calling from off-site, all beamline (BL) phone numbers that begin with a "2" are preceded by 495- (i.e., 495-2014); all others are preceded by 486-.

 

Beamline Number Source
Technique/ Group Name Energy Range Beamline Contact Schedule/BL Phone
1.4.3 Bend Infrared spectromicroscopy 0.05–1.2 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2231

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7519

x2014

1.4.4 Bend Infrared spectromicroscopy 0.05–1.2 eV

x2014

2.1 Bend National Center for X-Ray Tomography (NCXT)
400 - 1300 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-6892

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2411

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-5890

x5198
3.1 Bend Diagnostic beamline
Note: This beamline is NOT open to general users.
1-2 keV

W. Byrne
(510) 486-7517

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-5924

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-6028

x2031
3.2.1 Bend Commercial deep-etch x-ray lithography (LIGA)
Note: This beamline is NOT open to general users.
3-12 keV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2594

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-4276

 

x2032
3.3.2 Bend General x-ray testing station
Note: This beamline is NOT open to general users.
4-20 keV

A. MacDowell
(510) 486-4276

BL Web Site

x2033

4.0.2 EPU5 Magnetic spectroscopy 400-1500 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4834

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7102

 

Current

x2041

4.0.3 EPU9 High-resolution spectroscopy of complex materials (MERLIN)

9-100 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2328
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-5648

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2779

Current

x2049

4.2.2 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5,500-16,000 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(707) 567-7535

x6652
5.0.1 W11 Macromolecular crystallography (MX) 12,700 eV M. Allaire
(510) 486-4214
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2926

BL Web Site

x2051

5.0.2 W11 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-16 keV

BL Web Site

x2052

5.0.3 W11 Macromolecular crystallography (MX) 12,700 eV

BL Web Site

x2054

5.3.1 Bend Instrumentation development
Note: This beamline is NOT open to general users.
1,000 - 13,000 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2471

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2053

x2053
5.3.2.1 Bend Scanning transmission x-ray microscopy (STXM) 600-2000eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-7628

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4640

x2057
5.3.2.2 Bend Polymer scanning transmission x-ray microscopy (STXM) 250-800 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4640

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 859-6454

Current

x2057

5.4.1 Bend IR spectromicroscopy

0.07–1.25 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2231

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7519

x2654

5.4.3 Bend

High resolution far-IR to mid-IR spectroscopy

0.0025–1.5 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2231

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7519

--
6.0.1 U3

Ultrafast/femtosecond dynamics hard x-ray

Not open to general users.

2.3-9 keV

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(510) 495-2476

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-5585

x2087

6.0.2 U3

Ultrafast/femtosecond dynamics hard x-ray

Not open to general users.

250 eV- 2 keV

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(510) 495-2476

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-5585

x2087
6.1.2 Bend Soft x-ray microscopy 500-1300 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-6902

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-6622

x2061

6.3.1.1 Bend Magnetic spectroscopy 250-2000 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-4834

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-5926

Current

x2062

6.3.1.2 Bend Materials Science 250-2000 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2230

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7336

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7831

Current

TBA

6.3.2 Bend EUV calibrations 25-1300 eV

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(510) 486-6646

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(510) 486-6622

x2063
7.0.1 U5

COSMIC: Coherent Scattering and Microscopy

78-1200 eV

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(510) 486-7628

S. Roy
(510) 486-7438

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-5819

x2071

7.0.2 U5

MAESTRO

Commissioning

 

78-1200 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7628

T. Warwick
(510) 486-5819

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-4449

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(510) 486-4816

x2070

x2079

7.2 Bend Diagnostic beamline
Note: This beamline is NOT open to general users.
Far IR- 17 keV

F. Sannibale
(510) 486-5924

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7697

x2056
7.3.1 Bend Note: This beamline is NOT open to general users. 180-1500 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2375

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2845

x2073

7.3.3 Bend Small- and wide-angle x-ray scattering (SAXS/WAXS) 10 keV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-6435
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2665

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4395

BL Web Site

x2075

x2076

8.0.1 U5 Surface and materials science, wet-RIXS, iRIXS (previously SXF) 80-1250 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4989

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2230

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2779

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 486-7831

Current

x2080

x2089

8.2.1 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-16 keV

P. Zwart

(510) 486-4214

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2926

BL Web Site

x2081

8.2.2 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-16 keV

BL Web Site

x2082

8.3.1 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-17 keV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4587
G. Meigs
(510) 495-2249
x2083
8.3.2 Superbend Hard x-ray microtomography 6-46keV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2856

A. MacDowell
(510) 486-4276

BL Web Site

x2005

9.0.2 U10 Chemical dynamics 7.5-25 eV

O. Kostko

(510) 486-7706

B. Rude

(510) 495-2476

BL Web Site

x2092

9.3.1 Bend Atomic, molecular, and materials science
Not open to general users
2320-5600eV

E. Crumlin
(510) 486-6235

Z. Hussain

(510) 486-7591

Current

x2094

9.3.2 Bend Chemical and materials 30-850 eV

E. Crumlin
(510) 486-6235

Z. Hussain

(510) 486-7591

Current

x2109

10.0.1 U10 Angle- and spin-resolved photoelectron spectroscopy of solids 17-350 eV (HERS)
S-K Mo
(510) 495-2903
A. Fedorov
(510) 486-7521

BL Web Site

x2101

 

 

x2102

10.3.1 Bend X-ray fluorescence microprobe
Note: This beamline is NOT open to general users.
3–20 keV

S. Bailey

(510) 486-7727

M. Banda

(510) 495-2837



x2104
10.3.2 Bend Environmental and materials science, micro x-ray absorption spectroscopy (µXAS, µEXAFS) 2.4-17 keV

M. Marcus

(510) 495-2106

S. Fakra

(510) 495-2855

BL Web Site

Current

x2106

11.0.1 EPU 5 PEEM3, soft x-ray scattering

150–2000 eV

A. Scholl

(510) 486-6920

T. Young
(510) 486-7746

C. Wang

(510) 486-4082

Current

x2010

11.0.2.1 EPU5 Molecular environmental science/APXPS 75-2000 eV

H. Bluhm

(510) 486-5431
M. Gilles

(510) 495-2775

Current

x2077

11.0.2.2 EPU5 Molecular environmental science/STXM 130-2000 eV

D. Shuh

(510) 486-6937
D. Vine

(510) 486-4846

Current

x2077

11.3.1 Bend Small-molecule crystallography 6-17 keV

S. Teat
(510) 486-4457

L. McCormick (510) 495-2887

Current

x2117

11.3.2 Bend Inspection of EUV lithography masks
Note: This beamline is NOT open to general users.
50-1000 eV K. Goldberg
(510) 495-2261
P. Naulleau
(510) 486-4529
x2113
12.0.1 U8 EUV optics testing and interferometry, angle- and spin-resolved photoemission 25-300 eV (ARPES)
A. Fedorov
(510) 486-7521

(DCT/ MET)
P. Naulleau
(510) 486-4529
C. Anderson
(510) 486-5288

Current

x2121

 

 

 

x2120

12.0.2 U8 Coherent science (12.0.2.1) 300–1500 eV

S. Roy
(510) 486-7438
P. Naulleau
(510) 486-4529

E. Gullikson

(510) 486-6646

x2107

12.2.2 Superbend High-Pressure XRD 6-40 keV

M. Kunz
(510) 486-6789

C. Beavers

(510) 495-2448

BL Web Site

x2055

12.3.1 Superbend Structurally integrated biology for life sciences (SIBYLS) 5-17 keV G. Hura
(510) 486-5378
M. Hammel
(510) 486-5378
S. Classen
(510) 495-2697
x2134
12.3.2 Superbend Microdiffraction
6–22 keV

N. Tamura

(510) 486-6189

C. Stan

(510) 486-5335

Current

x4625

 

Storage Ring and Photon Source Information