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Beamline 12.2.2 Print
Tuesday, 20 October 2009 09:31
High-Pressure

 

Endstations:

 

GENERAL BEAMLINE INFORMATION

Operational

Yes

Source characteristics

Superbend magnet, 1.9GeV, 5.29Tesla, 500mA

Monochromator

Si(111) or Multilayer

Energy range

6-40 keV for Si(111), 14-28 keV for Multilayer

Resolving power (E/ΔE) Si(111) = 7000, Multilayer =100
Beam size (HxV) Focused: 10 x 10 micron
Unfocused: 90 x 100 micron

Scientific applications

High-pressure science

Scientific disciplines Earth sciences, materials science, construction materials, chemistry, energy.

Endstations

High-pressure single-crystal diffraction (in development, February 2015)

High pressure laser heating

Experimental techniques

Powder diffraction, high-pressure laser heating, high-pressure resistive heating, ambient-pressure high temperature, high-pressure single-crystal diffraction

Local contact

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Advanced Light Source, Berkeley Lab
Phone: (510) 495-2613

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Advanced Light Source, Berkeley Lab

Phone: (510) 495-2845

 

Spokespersons

Martin Kunz
Advanced Light Source, Berkeley Lab
Phone: (510) 495-2613

Beamline phone (510) 495-2055
Website

https://sites.google.com/a/lbl.gov/bl1222-high-pressure-xrd/home

 

ENDSTATION INFORMATION
Endstation name High-pressure single-crystal diffraction (in development, February 2015)

Detector TBD

Characteristics

Multi- axis single crystal diffractometer with maximal load capacity of 5 kg and combined sphere of confusion < 10 um

Beam size

~ 30 x 30 um

Calculated flux (1.9 GeV, 400 mA)

2 x 1011 photons/s through a 100-µm aperture at 20 keV with Si(111) monochromator

Calculated flux (1.9 GeV, 400 mA)

6 x 1012 photons/s through a 100-µm aperture at 20 keV with Multilayer monochromator

Sample format

Single crystals in DAC. DACs up to 5 kg

Sample preparation

Loaded into diamond anvil cells

Sample environment

Diamond anvil cell

Special notes

Set up planned to be available early 2016

 

ENDSTATION INFORMATION
Endstation name

High pressure laser heating after KB focussing of x-rays

Detectors

Mar345 Image Plate Reader or Perkin Elmer XRD 1621

Characteristics

Single axis sample position system to integrate DAC’s with double sided axial or radial laser heating

Spot size at sample

10 - 30 x 10 - 30 um.

Calculated flux (1.9 GeV, 400 mA)

3 x 109 photons/s through a 10-µm aperture at 20 keV for Si(111)

Sample format

Powders and liquids

Sample preparation

Samples are loaded into DAC’s with inert gases or other non-hazardous pressure media. Gas-loading for inert gases available

Sample environment

Diamond anvil cells (DACs), axial and radial laser heating, ambient pressure lamp furnace, resistive heating of Dac’s (partially under development)

Special notes

Offline ruby fluorescence pressure measurement available Online pressure measurement available summer 2015

 

More information:  Beamline 12.2.2 Web site.