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ALS Beamlines Directory Print
Monday, 31 August 2009 08:16


Beamlines, Parameters, Contact Information, and Schedules


 

Download a high-resolution version of the ALS Beamclock. See Beamclock to view the ALS energy-related beamlines beamclock.

 

Beamline Parameters

Beamline and endstation technical information is available through the links below. Unless otherwise noted, all beamlines are currently operational.
Individual beamline schedules are posted when available.

Please contact the responsible beamline scientist for additional schedule information. When calling from off-site, all beamline (BL) phone numbers that begin with a "2" are preceded by 495- (i.e., 495-2014); all others are preceded by 486-.

 

Beamline Number Source
 Technique/ Group Name Energy Range Beamline Contact Schedule/BL Phone
1.4.3 Bend Infrared spectromicroscopy 0.05–1.2 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2231

BL Web Site

x2014
1.4.4 Bend Infrared spectromicroscopy 0.05–1.2 eV

BL Web Site

x2014
2.1 Bend National Center for X-Ray Tomography (NCXT)
400 - 1300 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-6892		 x5198
3.1 Bend Diagnostic beamline
Note: This beamline is NOT open to general users.		 1-2 keV W. Byrne
(510) 486-7517		 x2031
3.2.1 Bend Commercial deep-etch x-ray lithography (LIGA)
Note: This beamline is NOT open to general users.		 3-12 keV This e-mail address is being protected from spambots. You need JavaScript enabled to view it x2032
4.0.2 EPU5 Magnetic spectroscopy 400-1500 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4834

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-5926

Jan-Jul 2013

x2041
4.0.3 EPU9 High-resolution spectroscopy of complex materials (MERLIN)

 9-100 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2328
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-5648

Jan-July, 2013

x2041
4.2.2 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5,500-16,000 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(707) 567-7535

 x6652
5.0.1 W11 Macromolecular crystallography (MX) 12,700 eV P. Zwart
(510) 486-4214
 This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2926

BL Web Site

x2051
5.0.2 W11 Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-16 keV

BL Web Site

x2052
5.0.3 W11 Macromolecular crystallography (MX) 12,700 eV

BL Web Site

x2054
5.3.1 Bend Instrumentation development
Note: This beamline is NOT open to general users.		 1,000 - 13,000 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2053		 x2031
5.3.2 Bend Polymer scanning transmission x-ray microscopy (STXM) 250-800 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4640

Jan-Jul 2013

x2057
5.4.1 Bend IR spectromicroscopy

 0.07–1.25 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2231		 x2654
5.4.3 Bend

High resolution far-IR to mid-IR spectroscopy

 0.0025–1.5 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2231		 --
6.0.1 U3 Ultrafast/femtosecond dynamics hard x-ray
 2.3-9 keV M. Hertlein
E. Glover
A. Scholl

Jan-Jul 2013

x2087
6.0.2 U3 Ultrafast/femtosecond dynamics soft x-ray 250 eV- 2 keV

 

 
6.1.2 Bend Soft x-ray microscopy 500-1300 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-7052

 

x2061
6.3.1 Bend Magnetic spectroscopy 400-2000 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-5926

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4834

Per-Anders Glans

(510) 486-7336

Jan-Jul 2013

x2062
6.3.2 Bend EUV calibrations 25-1300 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-6646		 x2063
7.0.1 U5 Surface and materials science, spectromicroscopy 78-1200 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2230
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-5975
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4816

BL Web Site

x2070

x2079

 

x2071
7.2 Bend Diagnostic beamline
Note: This beamline is NOT open to general users.		 Far IR- 17 keV F. Sannibale
(510) 486-5924		 x2073
7.3.1 Bend Note: This beamline is NOT open to general users. 180-1500 eV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-6920

 

x2073
7.3.3 Bend Small- and wide-angle x-ray scattering (SAXS/WAXS) 10 keV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-6435
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2665

BL Web Site

x2075

x2076
8.0.1 U5 Surface and materials science, wet-RIXS, soft x-ray fluorescence 65-1400 eV

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2080
(510) 495-2089

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2230

Jan-Jul 2013

 

x2080

x2089
8.2.1 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-16 keV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 495-2081
(510) 495-2082

BL Web Site

x2080
8.2.2 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-16 keV

BL Web Site

x2082
8.3.1 Superbend Multiple-wavelength anomalous diffraction (MAD) and macromolecular crystallography (MX) 5-17 keV This e-mail address is being protected from spambots. You need JavaScript enabled to view it
(510) 486-4587
J Tanamachi
(510) 495-2404
G. Meigs
(510) 495-2249		 x2083
8.3.2 Superbend Hard x-ray microtomography 6-46keV

A. MacDowell
(510) 486-4276

This e-mail address is being protected from spambots. You need JavaScript enabled to view it

(510) 495-2856

BL Web Site

x2005
9.0.1 U10 Diffraction microscopy
500-1500 eV D. Shapiro
(510) 486-7628
 x2091
9.0.2 U10 Chemical dynamics 7.5-25 eV M. Ahmed
(510) 486-6355
K. Wilson
(510) 495-2474

BL Web Site

x2092
9.3.1 Bend Atomic, molecular, and materials science
Note: This beamline is NOT open to general users.
 2320-5600eV W. Stolte
(510) 486-5804

Jan-Jul 2013

x2094
9.3.2 Bend Chemical and materials 30-850 eV

Z. Liu
(510) 486-5471
M. Grass
(510) 486-2733

Jan-Jul 2013

x2109
10.0.1 U10 Photoemission of highly correlated materials; high-resolution atomic, molecular, and optical physics 17-350 eV (HERS)
Sung-Kwan Mo
(510) 495-2903
(IPB/ESP/HiRAMES)
A. Aguilar
(510) 486-6235
D. Kilcoyne
(510) 486-4640

Jan-Jul 2013

x2101

 

 

x2102
10.3.1 Bend X-ray fluorescence microprobe
Note: This beamline is NOT open to general users.		 3–20 keV S. Cliff
(530) 867-2037

x2104
10.3.2 Bend Environmental and materials science, micro x-ray absorption spectroscopy (µXAS, µEXAFS) 2.4-17 keV M. Marcus
(510) 495-2106
S. Fakra
(510) 495-2106

Jan-Jul 2013

x2106
11.0.1 EPU 5 PEEM3, soft x-ray scattering

150–2000 eV A. Scholl
(510) 486-6920
T. Young
(510) 486-7746

Jan-July 2013

x2010
11.0.2 EPU5 Molecular environmental science 95-2000 eV D. Shuh
T. Tyliszczak
(510) 495-2077

Jan-Jul 2013

x2077
11.3.1 Bend Small-molecule crystallography 6-17 keV S. Teat
(510) 486-4457

Jan-Jul 2013

x2117
11.3.2 Bend Inspection of EUV lithography masks
Note: This beamline is NOT open to general users.
 50-1000 eV K. Goldberg
(510) 495-2261
P. Naulleau
(510) 486-4529
12.0.1 U8 EUV optics testing and interferometry, angle- and spin-resolved photoemission 25-300 eV (ARPES)
A. Fedorov
(510) 486-7521

(DCT/ MET)
P. Naulleau
(510) 486-4529
C. Anderson
(510) 486-5288


Jan-Jul 2013

x2121

 

 

 

x2120
12.0.2 U8 Coherent science 300–1500 eV S. Roy
(510) 486-7438
P. Naulleau
(510) 486-4529

 

x2107
12.2.2 Superbend High-Pressure XRD 6-40 keV

A. MacDowell

(510) 486-4276

S. Clark
(510) 495-2442

J. Knight

(510) 495-2716

BL Web Site

x2055
12.3.1 Superbend Structurally integrated biology for life sciences (SIBYLS) 5-17 keV G. Hura
(510) 486-5378
M. Hammel
(510) 486-5378
S. Classen
(510) 495-2697		 x2134
12.3.2 Superbend Microdiffraction
6–22 keV N. Tamura
(510) 486-6189
M. Kunz
(510) 486-6789

Jan-Jul 2013

x4625

 

Storage Ring and Photon Source Information

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