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Tuesday, 20 October 2009 08:37 |
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Polymer Scanning Transmission X-Ray Microscopy (STXM)
| GENERAL BEAMLINE INFORMATION |
| Operational |
Yes |
| Proposal cycle |
Proposals for General Sciences Beamlines (6-month cycle) |
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Source characteristics
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Bend magnet
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Energy range
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250-800 eV
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Monochromator
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Low-dispersion, spherical-grating monochromator, one grating
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Calculated flux (1.9 GeV, 400 mA)
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1 x 107 photons/s at sample
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Resolving power (E/ΔE)
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≤ 5,000
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Endstations
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Scanning transmission x-ray microscope (STXM)
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Characteristics
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Active servo-stabilized toroidal premirror
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Spot size at sample (FWHM)
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25 nm (theoretical), 31 nm actual
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| Scientific applications |
Photovoltaics, thin films, macromolecular chemistry, geology, cosmological chemistry, environmental, polymer chemistry, novel devices and materials. |
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Experimental techniques
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Microscopy, STXM
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Local contact
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Advanced Light Source, Berkeley Lab
Phone: (510) 486-4640
Fax: (510) 486-7588
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Spokesperson
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North Carolina State University
Phone: (919) 515-1331
Fax: (919) 515-7331
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Beamline phone numbers
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(510) 495-2057
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Website
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http://ssg.als.lbl.gov/ssgbeamlines/beamline5-3-2
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Science Highlights 
