Operational

Yes

Source characteristics

Bend magnet (beamline optics collect 0.166 horizontal mrad)

Energy range

2.5-17 keV

Monochromator

Monochromatic, with Si(111) two-crystal, constant-exit monochromator

Measured flux

9 x 10⁹ photons/s into 16 x 7 µm² spot at 6 keV

Resolving power (E/ΔE)

7000

Endstations

Hutch with optical table

Characteristics

Sample mounted on x-y-z translation stage

Detectors

Seven-element Ge solid-state fluorescence detector (XIA), Smart6000 Bruker CCD for µXRD, total electron yield device

Spot size at sample

From 2 x 2 µm² up to 16 x 7 µm² (full flux)

Sample format

Solids or liquids (in cells, capillaries, Si3N4 sandwiches). STXM samples OK.

Sample environment

Air, sample cooling to -30 C (Peltier) or 100 K (Cryo-Stream available). Typically 30 microns thick petrographic thin section.

Experimental techniques

Custom designed for micro X-ray absorption spectroscopy, micro X-ray fluorescence and micro X-ray diffraction.

Local contact / Spokesperson

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Advanced Light Source, Berkeley Lab
Phone: (510) 486-7604
Fax: (510) 486-7696

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Advanced Light Source, Berkeley Lab
Phone: (510) 495-2974
Fax: (510) 486-7696

Beamline phone number

(510) 495-2106