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Tuesday, 20 October 2009 09:16 |
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Scientific disciplines: Magnetism, materials, surface science, polymers
Endstations:
| GENERAL BEAMLINE INFORMATION |
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Operational
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Yes
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| Proposal cycle |
Proposals for General Sciences Beamlines (6-month cycle) |
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Source characteristics
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5.0-cm period elliptical polarization undulator (EPU5)
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Energy range
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150–2000 eV
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Monochromator
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VLS-PGM
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| Calculated flux (1.9 GeV, 400 mA) |
1013 photons/s/0.1%BW at 800 eV |
| Resolving power (E/ΔE) |
4,000 at 800 eV |
| Endstations |
11.0.1.1: Photoemission electron microscope (PEEM3)
11.0.1.2: Soft x-ray scattering |
| Special notes |
Polarization is user selectable; linear polarization continuously variable from horizontal to vertical; left and right elliptical (or circular) polarization |
| Scientific disciplines |
Magnetism, materials, surface science, polymers. |
| Scientific applications |
Real-time and pump-probe study of elemental, chemical, magnetic, and topographical properties of materials |
| Local contacts |
Andreas Scholl
Advanced Light Source, Berkeley Lab
Phone: (510) 486-6920
Fax: (510) 486-7696
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Advanced Light Source, Berkeley Lab
Phone: (510) 486-7746
Fax: (510) 486-7696
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| Spokesperson |
Joachim Stöhr
Stanford Synchrotron Radiation Laboratory
Phone: (650) 926-2570
Fax: (650) 926-4100 |
| Beamline phone |
(510) 495-2010 |
| Website |
http://xraysweb.lbl.gov/peem2/webpage/Home.shtml  |
| ENDSTATION INFORMATION |
Endstation name
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11.0.1.1: Photoemission electron microscope (PEEM3)
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| Detectors |
Slow scan CCD, fast APD point detector |
| Characteristics |
X-ray absorption spectromicroscopy |
| Spatial resolution |
Better than 50 nm depending on sample |
| Spot size at sample |
Adjustable down to 10 x 10 µm |
| Sample format |
UHV-compatible, flat, conductive samples up to 20 mm x 20 mm in area |
| Sample preparation |
Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability |
| Sample environment |
UHV, sample heating (800 K) and cooling (25 K), current pulses down to 20 ns |
| Scientific applications |
Real-time and pump-probe study of elemental, chemical, magnetic, and topographical properties of materials |
| ENDSTATION INFORMATION |
Endstation name
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11.0.1.2: Soft x-ray scattering |
| Detectors |
In-vacuum CCD, PhotoDiode |
| Characteristics |
X-ray scattering using resonant soft x-ray |
| Spatial resolution |
>2 nm |
| Spot size at sample |
100 x 100 µm |
| Sample format |
Polymer thin films, solid thin films, vacuum compatible liquid cell |
| Sample environment |
High vacuum, heating |
| Scientific applications |
Polymer science, energy research |
| Local contact |
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab
Phone: (510) 486-6435
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Advanced Light Source, Berkeley Lab
Phone: (510) 486-4082
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