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Beamline 10.0.1 Print

 

Angle- and Spin-Resolved Photoelectron Spectroscopy of Solids

 

Scientific disciplines: Strongly correlated electron systems, magnetism

 

Endstations:

 

GENERAL BEAMLINE INFORMATION

Operational

Yes

Source characteristics

10-cm period undulator (U10) (first and third harmonics)

Energy range

17-350 eV

Monochromator

Spherical grating monochromator
(380, 925, 2100 lines/mm gratings)

Calculated and measured flux (1.9 GeV, 400 mA)

Up to 1013 photons/s/0.01% BW at 30 eV

Resolving power (E/ΔE)

Grating and energy dependent;
demonstrated E/ΔE ~35,000 at ~60 eV

Scientific disciplines Materials and applied science, strongly correlated electron systems

Endstations

High energy resolution spectrometer (HERS)
Spin- and angle-resolved photoelectron spectroscopy (spin-ARPES)

Local contacts/spokespersons

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab
Phone: (510) 495-2903
Fax: (510) 495-2067

 

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab
Phone: (510) 486-7521
Fax: (510) 495-2067

Beamline phone numbers

(510) 495-2102 (spin-ARPES)
(510) 495-2101 (HERS)

 

ENDSTATION INFORMATION

Endstation name

High energy resolution spectrometer (HERS): Angle-resolved photoemission

Characteristics

Designed for very high resolution and angle-resolved photoemission spectroscopy at cryogenic temperatures. The electron energy analyzer rotates 120° about the incoming beam.

Angular resolution

±0.2°

Detectors

Scienta SES R4000 hemispherical electron energy analyzer with angular mode
LEED, RHEED

Spot size at sample

150 (h) x <100 (v) µm depending on exit-slit setting

Samples

Strongly correlated materials

Sample format

Solid-state crystals, thin films

Sample preparation

Sample manipulator with 6 degrees of freedom and a temperature range of
8 to 400 K. Deposition, sputtering, and annealing. MBE growth.

Sample environment UHV < 4.0 x 10-11

Scientific applications

Studies of highly correlated electron systems using angle-resolved photoemission of solids

Experimental techniques

Angle-resolved photoemission from solids

Local contact/spokesperson

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab
Phone: (510) 495-2903
Fax: (510) 495-2067

 

ENDSTATION INFORMATION

Endstation name

Spin- and angle-resolved photoemission from solids (spin-ARPES)

Characteristics

Photoelectron spectroscopy of bulk single crystals and thin crystalline films for chemical analysis and band-structure mapping with sensitivity to the spin of the photoelectron

Detectors

VG-Scienta R4000 with Mott polarimeter (spin-resolved and regular ARPES)

VG-Scienta SES-100 (regular ARPES)

Spot size at sample

~100 x 100 microns

Sample format

UHV-compatible solids

Sample preparation and manipulation

UHV cleave, ion sputtering, high-temperature annealing, evaporation, simple MBE growth (e.g. Bi2Se3)

Computer-controlled sample manipulator with 6 degrees of freedom

Temperature control from 7 to 375 K (open-cycle He cryostat)

Sample environment UHV
Scientific applications Measurements of spin-resolved band structure

Scientific disciplines

Materials and applied science, magnetism, strongly correlated electron systems

Local contact/spokesperson

This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab
Phone: (510) 486-7521
Fax: (510) 495-2067