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Scientific disciplines: Magnetism, materials, surface science, polymers
Note: This beamline is NOT open to general users.
| GENERAL BEAMLINE INFORMATION |
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Operational
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Yes, but not open to users
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Source characteristics
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Bend magnet
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Energy range
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180-1500 eV
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Monochromator
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SGM
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Calculated flux (1.9 GeV, 400 mA)
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3 x 1012 photons/s/0.1%BW at 800 eV (linearly polarized)
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Resolving power (E/ΔE)
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1,000
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Endstations
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Photoemission electron microscope (PEEM2)
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Characteristics
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X-ray absorption spectromicroscopy
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Spatial resolution
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Below 100 nm
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Detectors
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Slow scan CCD
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Spot size at sample
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30 x 30 µm
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Sample format
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UHV-compatible flat, conductive samples up to 1 cm2 in area
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Sample preparation
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Sputter-cleaning, heating, e-beam and sputter evaporation, LEED, transfer capability, magnet (1 kOe)
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Sample environment
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UHV, sample heating (800 K)
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Special notes
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Choice of linearly or circularly polarized radiation (flux of circularly polarized radiation is reduced)
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| Scientific disciplines |
Magnetism, materials, surface science, polymers. |
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Scientific applications
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Real-time and pump-probe study of elemental, chemical, magnetic, and topographical properties of materials
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Local contact
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This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab
Phone: (510) 486-4867
Fax: (510) 486-7696
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Spokesperson
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This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Stanford Synchrotron Radiation Laboratory
Phone: (650) 926-2570
Fax: (650) 926-4100
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Beamline phone number
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(510) 495-2073
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| Website |
http://xraysweb.lbl.gov/peem2/webpage/Home.shtml  |
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