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Scientific disciplines: Surface chemistry, environmental, planetary, biological, and medical sciences
Endstations:
| GENERAL BEAMLINE INFORMATION |
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Operational
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Yes
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| Proposal cycle |
Proposals for General Sciences Beamlines (6-month cycle) |
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Source characteristics
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5.0-cm period elliptical polarization undulator (EPU5)
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Energy range
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See endstation tables
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Monochromator
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See endstation tables
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Endstations
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Ambient-pressure photoemission spectroscopy Scanning transmission x-ray microscope (STXM)
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| Local contacts |
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Chemical Sciences Division, Berkeley Lab Phone: (510) 495-2796 Fax: (510) 486-5596
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Advanced Light Source, Berkeley Lab Phone: (510) 486-5188 Fax: (510) 495-2067 |
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Chemical Sciences Division, Berkeley Lab Phone: (510) 495-2775 Fax: (510) 495-2067
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| Spokesperson |
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Chemical Sciences Division, Berkeley Lab Phone: (510) 486-6937 Fax: (510) 486-5596 |
Beamline phone numbers
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(510) 495-2077 (510) 495-2119 |
| Website |
http://beamline1102.als.lbl.gov  |
| ENDSTATION INFORMATION |
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Endstation name
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Ambient-pressure photoemission spectroscopy (APPES)
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| Detector |
Specs electron energy analyzer |
| Characteristics |
Photoelectron emission spectroscopy at relatively high gas pressure |
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Energy range
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75-2000 eV
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Monochromator
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Variable-included-angle PGM
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Calculated flux (1.9 GeV, 400 mA)
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5 x 1012 photons/s
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Resolving power (E/ΔE)
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2500-7500
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Spot size at sample (FWHM)
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10 x 10 µm
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| Sample format |
Solid, liquid on solid, gas on solid |
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Sample environment
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UHV, up to 10 Torr gas or vapor
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Scientific applications
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Surface chemistry, catalysts, environmental science.
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Experimental techniques
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XPS, NEXAFS
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Local contact
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This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Chemical Sciences Division, Berkeley Lab Phone: (510) 495-2796 Fax: (510 486-5596
|
| ENDSTATION INFORMATION |
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Endstation name
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Scanning transmission x-ray microscope (STXM)
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Energy range
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130-2000 eV
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Monochromator
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Variable-included-angle PGM
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| Detectors |
Scintillator with PMT, APD |
| Characteristics |
X-ray spectromicroscopy with <20 nm resolution |
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Calculated flux (1.9 GeV, 400 mA)
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~109 photons/s
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Resolving power (E/ΔE)
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2500-7000
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Spatial resolution
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14tom nm
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Spot size at sample
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20 x 20 nm
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Sample format
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Thin sections, films, and particulates (50–1000 nm thick); 3 x 3 mm in area
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Sample preparation
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No preparation chamber available
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Sample environment
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Helium up to 1 atm, vacuum to 10-2 Torr, inert gas up to 1 atm
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Special notes
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Samples may be wet or dry; thin films may be deposited on silicon nitride windows or TEM grid. External magnetic field can be applied—up to 600 G.
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Scientific applications
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Environmental, magnetic dynamics, actinides, planetary, biological, medical
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Experimental techniques
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Imaging, NEXAFS in small spots; chemical mapping at <20-nm resolution
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Local contact
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This e-mail address is being protected from spambots. You need JavaScript enabled to view it
Advanced Light Source, Berkeley Lab Phone: (510) 486-5188 Fax: (510) 495-2067
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