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Infrared spectromicroscopy
| GENERAL BEAMLINE INFORMATION |
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Operational
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2011
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Source characteristics
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Bend magnet
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Energy range
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0.07–1.25 eV
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Frequency range
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600 - 10,000 cm-1
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Interferometer resolution
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0.125 cm-1
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Endstations
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FTIR bench and IR microscope (N2 purged)
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Characteristics
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Computerized sample stage, 0.1-micron resolution; reflection, transmission, and attenuated total reflectance (ATR) modes; polarizing and UV fluorescence optics
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Spatial resolution
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Diffraction limited (~wavelength)
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Detectors
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Probably MCT-A*, MCT-B (mercury cadmium telluride)
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Spot size at sample
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2-10 µm (diffraction-limited)
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Sample preparation
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Biological preparation equipment available including incubator, biohoods, prep table, and more TBD.
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Sample environment
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N2 purged, minimal clean area (no particle specification), microcryostat/heater stages available for 4.2–730 K
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Scientific applications
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Biological samples, environmental samples, novel compounds, forensic studies, laminates, polymers, fibers, particulate contamination, material sciences, gas phase molecules and clusters.
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Local contact / Spokespeson
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Michael C. Martin Advanced Light Source, Berkeley Lab Phone: (510) 495-2231 Fax: (510) 495-2067
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Environmental Sciences Division, Berkeley Lab Phone: (510) 486-7118 Fax: (510) 486-5686
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Beamline phone number
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(510) 495-2654
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More information about IR research at the ALS is available on the Infrared Beamlines Web site.
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